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Tuesday, July 1, 2008

Agilent Technologies' New X-Series Measurement Application Automates LTE Measurements

Agilent Technologies press release
Agilent Technologies Inc. today introduced a new 3GPP LTE measurement application for its X-Series signal analyzers. Providing the industry's most comprehensive embedded solution with hardkey/softkey and SCPI programming user interface, the measurement application brings physical layer testing of uplink (UL) and downlink (DL) LTE signals to the test rack. When coupled with the industry-leading speed of Agilent's X-Series analyzers, it offers some of the fastest LTE measurements in the market, making it especially well-suited for use in automated testing during design validation and prototype production.

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