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Wednesday, February 18, 2009

Agilent Technologies to Demonstrate Bench-Top LTE RF Mobile Device Characterization on E6620 Platform

Source: Agilent Technologies press release
Agilent Technologies Inc. today announced it will demonstrate LTE EVM, Tx power measurements and downlink transmit diversity for mobile device test using the E6620 wireless communications test set here at Mobile World Congress. Agilent will offer these capabilities for bench-top device test via LTE mobile test software for the E6620, as well as in its design verification test system based on the E6620. This demonstration marks the first-ever public showing of LTE UE RF measurements on a one-box tester.

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