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Wednesday, February 18, 2009

Rohde & Schwarz presents LTE test demonstration with TriQuint Semiconductor at Mobile World Congress

Source: Rohde & Schwarz press release
At the upcoming Mobile World Congress (February 16 to 19, 2009) in Barcelona, Rohde & Schwarz will showcase a complete LTE FDD test setup demonstrating the LTE compliance of TriQuint Semiconductor’s latest TRITIUM III PA-Duplexer Module™ family.

For the LTE test demonstration, LTE FDD test signals are generated by the R&S®SMBV100A vector signal generator and transmitted to the UMTS2100 band 1 TRITIUM III PA-Duplexer Module™, TQM676021. Accurate decoding and detailed analysis of the resulting signal are carried out by the R&S®FSV signal and spectrum analyzer from Rohde & Schwarz, providing information about the module’s performance.

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